Y.-C. Tsai, C. Bayram, and J.-P. Leburton, “Interplay between Auger Recombination, Carrier Leakage, and Polarization in InGaAlN Multiple-Quantum-Well Light-Emitting Diodes,” J. Appl. Phys., vol. 131, 193102 May 2022. DOI: https://doi.org/10.1063/5.0089463

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